> IEEE, USB interfaces
> DUT monitoring, Fail , Fail
> External test generators
> ACC capacitive coupling clamp, ISO - (CCC)
> BCI clamp, ISO - (ICC)
> External impedance
> External trigger input
EASY TO CONNECT
em.fl ow OPERATIONAL CONCEPT
> Extremely easy to operate
> Parameters can be set even during the test
> Quick start
> Standard programs
> User programs
> Select directly from standard test levels
> Statistical test options
> Prede ned tests
MODULE FREESTYLE
PULSE PARAMETERS
> Test voltage: up to V
> Rise time: t
r
= µs to µs
> Pulse duration: t
d
= µs to , µs
> Internal resistance: R
i
= to
MODULE CN COUPLING NETWORK
TYPE CN
> Central DUT output
> Overlap of all test pulses on DUT supply line
> Available in versions up to V, A
MODULE MPG
ISO /
> Pulse ( V/ V)
> Pulse a ( V/ V)
> Nearly all international vehicle manufacturer
speci cations
UCS N:
VERSATILITY.
MODULE JASO
JASO D, D, DA
> Pulse A, B, D
> JASO de nes the pulse-forming network
and the components to be used
MODULE NISSAN
NISSAN NDS
> Puls B, C, C and C
> Nissan de nes the pulse-forming network
and the components to be used
MODULE SAE
SAE J
> Mutual pulse
> Inductive pulse
Safety circuitWarning lamp
MODULE EFT
ISO /
> Pulse a, b
> Test voltage up to , V
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